Analysis and Design of a Low Noise Shunt-Shunt CMOS Transimpedance Ampli er for 10 Gbps Optoelectronic Receivers
André F. Ponchet, Jacobus, W. Swart, Ezio M. Bastida, Célio A. Finardi, Roberto R. Panepucci, Stefan Tenenbaum and Saulo Finco

Bias Stress Effects in Low Temperature Amorphous Hf-In-ZnO TFTs Using RF-sputtering HfO2 as High-k Gate Dielectric.
C.A. Pons-Flores, I. Hernández, I. Garduno, I. Mejía, M. Estrada

A Compact Eight-terminal Piezotransducer for Stress Measurements in Silicon
Jose L. Ramirez and Fabiano Fruett

Boosting the MOSFETs Matching by Using Diamond Layout Style
Vinicius Vono Peruzzi; Christian Renaux; Denis Flandre, Salvador Pinillos Gimenez

Characterization of Birefringent Titanium-Oxide Thin Films Deposited by DC Sputtering
H. P. de Araújo and S. G. dos Santos Filho

Advantageous Sampling of Correlated Current Signals to Supress Fixed-Pattern Noise in CMOS Imagers
R. A. Souza, L. G. M. Ventura, A. R. S. Martins, D. W. de Lima Monteiro, L. P. Salles

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