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A Study of Flicker Noise in MOS Transistor Under Switched Bias Condition
Matías Miguez and Alfredo Arnaud
Study of Matching Properties of Graded-Channel SOI MOSFETs
Michelly de Souza, Denis Flandre and Marcelo A. Pavanello
Parameters Extraction from C-V Curves in Triple-Gate FinFET
Michele Rodrigues, Victor Sonnenberg and João Antonio Martino
Stress Analysis on Ultra Thin Ground Wafers
Ricardo C. Teixeira, Koen de Munck, Piet de Moor, Kris Baert, Bart Swinnen, Chris Van Hoof and Alexsander Knüettel
Gate Oxide Thickness Influence on the Gate Induced Floating Body Effect in SOI Technology
Paula Ghedini Der Agopian, João Antonio Martino, Eddy Simoen and Cor Claeys
Fabrication of Silicon Microtips with Integrated Electrodes
Murilo Z. Mielli, Alex L. Barros, Alexandre T. Lopes and Marcelo N. P. Carreño
Cover, back-cover,
foreword and sumario |