SPECIAL SECTION ON BEST SBMicro 2011 PAPERS

Induced Optical Losses in Optoelectronic Devices due Focused Ion Beam Damages
F. Vallini, L. A. M. Barea, E. F. dos Reis, A. A. von Zuben and N. C. Frateschi

Modeling of Thin-Film Lateral SOI PIN Diodes with an Alternative Multi-Branch Explicit Current Model
D. Lugo-Muñoz, J. Muci, A. Ortiz-Conde, F. J. García-Sánchez, M. de Souza, D. Flandre, and M. A. Pavanello

A Simple Electron Mobility Model Considering the Silicon-Dielectric Interface Orientation for Circular Surrounding-Gate Transistor
A. L. Perin, A. S. N. Pereira, P. G. D. Agopian, J.A. Martino, and R. Giacomini

SOI n- and pMuGFET devices with different TiN metal gate thickness and crystallographic orientation of the sidewalls
M. Rodrigues, M. Galeti, N. Collaert, E. Simoen, C. Claeys, and J. A. Martino

One Transistor Floating Body RAM Performances on UTBOX Devices Using the BJT Effect
L.M.Almeida, K.R.A.Sasaki, M.Aoulaiche, E.Simoen, C.Claeys, and J.A.Martino

Impact of the Series Resistance in the I-V Characteristics of Junctionless Nanowire Transistors and its dependence on the Temperature
R. T. Doria, R. D. Trevisoli, M. de Souza, and M. A. Pavanello

REGULAR PAPERS

Relative-Air Humidity Sensing Element Based on Heat Transfer of a Single Micromachined Floating Polysilicon Resistor
P. Zambrozi Jr. and F. Fruett

Fin Cross-Section Shape Influence on Short Channel Effects of MuGFETs
R. T. Bühler, R. Giacomini, M. A. Pavanello, and J. A. Martino

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