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SPECIAL SECTION ON BEST SBMicro 2011 PAPERS
Induced Optical Losses in Optoelectronic Devices due Focused Ion Beam Damages
F. Vallini, L. A. M. Barea, E. F. dos Reis, A. A. von Zuben and
N. C. Frateschi
Modeling of Thin-Film Lateral SOI PIN Diodes with an Alternative
Multi-Branch Explicit Current Model
D. Lugo-Muñoz, J. Muci, A. Ortiz-Conde, F. J. García-Sánchez,
M. de Souza, D. Flandre, and M. A. Pavanello
A Simple Electron Mobility Model Considering the Silicon-Dielectric
Interface Orientation for Circular Surrounding-Gate Transistor
A. L. Perin, A. S. N. Pereira, P. G. D. Agopian, J.A. Martino,
and R. Giacomini
SOI n- and pMuGFET devices with different TiN metal gate thickness
and crystallographic orientation of the sidewalls
M. Rodrigues, M. Galeti, N. Collaert, E. Simoen, C. Claeys,
and J. A. Martino
One Transistor Floating Body RAM Performances on UTBOX
Devices Using the BJT Effect
L.M.Almeida, K.R.A.Sasaki, M.Aoulaiche, E.Simoen, C.Claeys,
and J.A.Martino
Impact of the Series Resistance in the I-V Characteristics of Junctionless
Nanowire Transistors and its dependence on the Temperature
R. T. Doria, R. D. Trevisoli, M. de Souza, and M. A. Pavanello
REGULAR PAPERS
Relative-Air Humidity Sensing Element Based on Heat Transfer of a Single Micromachined Floating Polysilicon Resistor
P. Zambrozi Jr. and F. Fruett
Fin Cross-Section Shape Influence on Short Channel
Effects of MuGFETs
R. T. Bühler, R. Giacomini, M. A. Pavanello, and J. A. Martino
Cover, back-cover,
foreword and sumario
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