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On the Variability of the Low-Frequency Noise in UTBOX SOI
nMOSFETs
E. Simoen, M.G.C. Andrade, L. M. Almeida, M. Aoulaiche, C. Caillat,
M. Jurczak and C. Claeys
Reliability Concerns due to Self-Heating effects in GaN HEMTs
B. Padmanabhan, D. Vasileska and S. M. Goodnick
Pressure Sensor Systems for Wide Pressure Ranges Integrated
by a Combined CMOS and MEMS Technology
W. Schreiber-Prillwitz and R. Job
Detection of Transient Faults in Nanometer Technologies
by using Modular Built-In Current Sensors
F. S. Torres and R. P. Bastos
A Novel Pseudo NMOS Integrated CC -ISFET Device for Water
Quality Monitoringt
P. Whig and S. N. Ahmad
Selective and Anisotropic Dry Etching of Ge over Si
M. S. B. Castro, S. Barnola and B. Glück
Nanowire Tunnel Field Effect Transistors at High Temperature
M. D. V. Martino, F. S. Neves, P. G. D. Agopian, J. A. Martino,
R. Rooyackers and C. Claeys
Drain Current and Short Channel Effects Modeling in Junctionless
Nanowire Transistors
R. D. Trevisoli, R. T. Doria, M. de Souza and M. A. Pavanello
Cover, back-cover,
foreword and sumario
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