On the Variability of the Low-Frequency Noise in UTBOX SOI nMOSFETs
E. Simoen, M.G.C. Andrade, L. M. Almeida, M. Aoulaiche, C. Caillat, M. Jurczak and C. Claeys

Reliability Concerns due to Self-Heating effects in GaN HEMTs
B. Padmanabhan, D. Vasileska and S. M. Goodnick

Pressure Sensor Systems for Wide Pressure Ranges Integrated by a Combined CMOS and MEMS Technology
W. Schreiber-Prillwitz and R. Job

Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors
F. S. Torres and R. P. Bastos

A Novel Pseudo NMOS Integrated CC -ISFET Device for Water Quality Monitoringt
P. Whig and S. N. Ahmad

Selective and Anisotropic Dry Etching of Ge over Si
M. S. B. Castro, S. Barnola and B. Glück

Nanowire Tunnel Field Effect Transistors at High Temperature
M. D. V. Martino, F. S. Neves, P. G. D. Agopian, J. A. Martino, R. Rooyackers and C. Claeys

Drain Current and Short Channel Effects Modeling in Junctionless Nanowire Transistors
R. D. Trevisoli, R. T. Doria, M. de Souza and M. A. Pavanello

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