Invited Papers
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SoC Self-test with Logic BIST
Alexandre S. Lujan, Rubens Takiguti, Marcelo Fukui
BSTC, Freescale Semiconductors, Campinas, Brazil
September 3rd, Thursday, 10:00 to 10:40
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Presenter: Alexandre S. Lujan
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Abstract: LBIST is a well known and proven technique to test logic circuit in devices without the need of external test equipment. Such device standalone test capability becomes a very adequate way to satisfy upcoming Safety standards in sensitive applications, where occasional undesired defects during the device regular life cycle can be flagged by LBIST periodic runs. Despite convenient, LBIST has significant limitations. With the right usage scope, though, LBIST is indeed a powerful resource.
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Short-Bio: Received the B.Sc. degree in applied physics, 1986, and the M.Sc. in physics, 1991, both from Campinas State University (UNICAMP), Campinas, Brazil. From 2000 to 2007, he was with Semikron Semicondutores Ltda., Carapicuíba, Brazil, working on the development of power semiconductor devices. Since 2008 he has been with Freescale Semicondutores Ltda., Campinas, Brazil, working on DFT for SoC chips in C90, C55, C40 and C28 technologies. His current research interests are DFT for SoC chips including compressed ATPG and LBIST. |
