A Review of SOI Technology and its Applications
Bich-Yen Nguyen, George Celler, Carlos Mazuré

Mobility Modeling in Advanced MOSFETs with Ultra-Thin Silicon Body under Stress
Viktor A. Sverdlov, Thomas Windbacher, Franz Schanovsky, Siegfried Selberherr

Investigation of the Gate Length and Drain Bias Dependence of the ZTC Biasing Point Instability of N- and P-Channel PD SOI MOSFETs
L. M. Camillo, J. A. Martino, E. Simoen, C. Claeys

Analysis of Electromigration in Dual-Damascene Interconnect Structures
Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr

Waferlevel Vacuum Packaged Microscanners: A High Yield Fabrication Process for Mobile Applications
Marten Oldsen, Ulrich Hofmann, Joachim Janes, Hans-Joachim Quenzer, Bernd Wagner

Preparation and Characterization of Electrodeposited Co/p-Si Schottky Diodes
R. Zandonay, R. G. Delatorre, A. A. Pasa

Time-of-Flight Flow Microsensor using Free-Standing Microfilaments
Roberto Jacobe Rodrigues, Rogério Furlan

Cover, back-cover, foreword and sumario