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A Review of SOI Technology and its Applications
Bich-Yen Nguyen, George Celler, Carlos Mazuré
Mobility Modeling in Advanced MOSFETs with Ultra-Thin Silicon
Body under Stress
Viktor A. Sverdlov, Thomas Windbacher, Franz Schanovsky,
Siegfried Selberherr
Investigation of the Gate Length and Drain Bias Dependence of the ZTC
Biasing Point Instability of N- and P-Channel PD SOI MOSFETs
L. M. Camillo, J. A. Martino, E. Simoen, C. Claeys
Analysis of Electromigration in Dual-Damascene Interconnect Structures
Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr
Waferlevel Vacuum Packaged Microscanners: A High Yield Fabrication Process
for Mobile Applications
Marten Oldsen, Ulrich Hofmann, Joachim Janes, Hans-Joachim Quenzer,
Bernd Wagner
Preparation and Characterization of Electrodeposited
Co/p-Si Schottky Diodes
R. Zandonay, R. G. Delatorre, A. A. Pasa
Time-of-Flight Flow Microsensor using Free-Standing Microfilaments
Roberto Jacobe Rodrigues, Rogério Furlan
Cover, back-cover,
foreword and sumario |